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| fluorescence interference contrast microscopy ： ウィキペディア英語版 |
fluorescence interference contrast microscopy
Fluorescence interference contrast (FLIC) microscopy is a microscopic technique developed to achieve z-resolution on the nanometer scale.
FLIC occurs whenever fluorescent objects are in the vicinity of a reflecting surface (e.g. Si wafer). The resulting interference between the direct and the reflected light leads to a double sin2 modulation of the intensity, I, of a fluorescent object as a function of distance, h, above the reflecting surface. This allows for the ''nanometer height measurements''.
FLIC microscope is well suited to measuring the topography of a membrane that contains fluorescent
probes e.g. an artificial lipid bilayer, or a living cell membrane or the structure of fluorescently labeled proteins on a surface.
==FLIC optical theory==
抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』
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